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静岡大学地球科学研究報告 (1975-) >
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タイトル: 走査型X線分析顕微鏡画像の解析による層状斑れい岩の鉱物分布マップの作成
その他のタイトル: lmage analysis of elemental X-ray maps of layered gabbro obtained by the scanning X-ray analytical microscope
著者: 道林, 克禎
戸上, 昭司
足立, 佳子
内山, 尚和
掲載誌名: 静岡大学地球科学研究報告
出版者: 静岡大学地球科学教室
巻: 29
開始ページ: 103
終了ページ: 112
出版日付: 2002-07
NDC: 458
抄録: The pixel-intensities from X-ray fluorescence (XRF) images of a layered gabbro obtained using a scanning X-ray analytical microscope (SXAM) have been used to produce mineral-distribution images or maps of the layered gabbro. Maps of the major elements, including Al, Si, Ca, Fe, were obtained with the SXAM. To transform these elementdistribution maps into mineral-distribution maps, we employed the Togami et al. (1998)'s method : a least squares method. The coefficient of XRF intensity and the proportion of a desired mineral was determined from the average value in a few thousand pixels that record the XRF intensity of the desired mineral in isolation. Experiments with the gabbro sample showed that the least squares method gives appropriate mineral-distribution maps if the acquisition time for the XRF maps is sufficiently long : e.g., at least 24 hours for the gabbro.
ISSN: 03886298 OPAC
NII論文ID: 110000413419 ciniia
NII書誌ID: AN00103190 OPAC ciniib
バージョン: publisher
出現コレクション:2002 29

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Others By: 道林, 克禎 (ミチバヤシ, カツヨシ) (Michibayashi, Katsuyoshi) -- 戸上, 昭司 -- 足立, 佳子 -- 内山, 尚和



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