Shizuoka University REpository  title image 
morning
day
evening
night
shizuppy
 

SURE: Shizuoka University REpository >
21. 電子工学研究所 = Research Institute of Electronics >
21. 雑誌論文・記事(Journal Article, Article, Preprint) >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10297/4226
Bookmark and Share

Files in This Item:

File Description SizeFormat
100121001.pdf807.7 kBAdobe PDFThumbnail
View/Open

Title: Seebeck Coefficient of Ultrathin Silicon-on-Insulator Layers
Authors: Salleh, Faiz
Asai, Kiyosumi
Ishida, Akihiro
Ikeda, Hiroya
Journal Title: Applied Physics Express
Publisher: Japan Society of Applied Physics
Journal Volume: 2
Journal Issue: 7
Start Page: 071203-1
End Page: 071203-3
Issue Date: 2009-07
Rights: Copyright © 2009 The Japan Society of Applied Physics
NDC: 549
ISSN: 18820778 OPAC
E-ISSN: 18820786 OPAC
DOI: 10.1143/APEX.2.071203   
Article NAID: 10025087049 ciniia
Journal NCID: AA12295133 OPAC ciniib
Textversion: author
Appears in Collections:21. 雑誌論文・記事(Journal Article, Article, Preprint)

Google™ Scholar: Cited By - Related - Other Copies

Others By: Salleh, Faiz -- Asai, Kiyosumi -- Ishida, Akihiro (石田, 明広) (イシダ, アキヒロ) -- Ikeda, Hiroya (池田, 浩也) (イケダ, ヒロヤ)

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

DSpace Software Copyright © 2002-2010  Duraspace - Feedback