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Title: Comparison of Thermal Stability of Epitaxially Grown (La0.5Sr0.5)CoO3 and (La0.6Sr0.4)MnO3 Thin Films Deposited on Si Substrate
Authors: Sawamura, Shigeki
Sakamoto, Naonori
Fu, De Sheng
Shinozaki, Kazuo
Suzuki, Hisao
Wakiya, Naoki
Journal Title: Key Engineering Materials
Publisher: Materials Science and Engineering
Journal Volume: 445
Start Page: 160
End Page: 163
Issue Date: 2010-07
NDC: 425
Abstract: Thermal stability of bottom electrode thin films (La0.5Sr0.5)CoO3 (LSCO) and (La0.6Sr0.4)MnO3 (LSMO) were investigated. The crystallization and surface morphology of the heterostructure were characterized using x-ray diffraction and atomic force microscopy. Resistivity of the LSCO thin film was 25 cm. However, the resistivity of LSCO thin film increases sharply with annealing temperature. The LSMO thin film has high resistivity (100 mcm). The film does not decompose after thermal processing at 900 °C. To confirm thermal stability, we examined the effect of post annealing at various temperatures on the morphology and resistivity. Results showed that LSMO has higher thermal stability than that of LSCO.
ISSN: 10139826 OPAC
E-ISSN: 16629795 OPAC
Publisher's DOI: 10.4028/   
Journal NCID: AA10697012 OPAC ciniib
Textversion: author
Appears in Collections:05. 雑誌論文・記事(Journal Article, Article, Preprint)

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Others By: Sawamura, Shigeki -- Sakamoto, Naonori (坂元, 尚紀) (サカモト, ナオノリ) -- Fu, De Sheng (符, 徳勝) (フ, トクショウ) (Fu, Desheng) -- Shinozaki, Kazuo -- Suzuki, Hisao (鈴木, 久男) (スズキ, ヒサオ) -- Wakiya, Naoki (脇谷, 尚樹) (ワキヤ, ナオキ)

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